Quantum

The Impact of Internal Electric Fields on Accurate Diamond Magnetometry

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Based on a feed excerpt; full article content has not been acquired. Source evidence retrieved 04/11/2026, 05:13:25 UTC.

Briefings

A new study characterizes random internal electric fields (RIEFs) in diamond that shift NV center spin-transition frequencies, causing systematic errors exceeding g-factor uncertainty below 5 mT. The authors propose an analytical fitting function to correct these errors, reducing them by nearly an order of magnitude. This work uses Monte Carlo simulations to quantify RIEF-induced errors in optically detected magnetic resonance (ODMR) spectra, demonstrating that RIEFs significantly impact the accuracy of NV quantum sensing.

Key points

• Random internal electric fields (RIEFs) in diamond shift NV center spin-transition frequencies, causing systematic errors exceeding g-factor uncertainty below 5 mT.
• The authors propose an analytical fitting function to correct RIEF-induced errors, reducing them by nearly an order of magnitude compared to standard analysis approaches.

Context

Nitrogen-vacancy (NV) center spin ensembles are a promising platform for accurate vector magnetometry, but charged dopants produce random internal electric fields (RIEFs) that shift NV spin-transition frequencies. This study characterizes RIEFs' effect on NV spin-transition spectra and proposes an analytical fitting function to improve accuracy in their presence.

Limitations

The study uses experimental ODMR spectra as a testbed for Monte Carlo RIEF modeling. Systematic errors were observed below 5 mT, but the specific impact of RIEFs on other magnetic field ranges remains unquantified. The proposed fitting function was validated against known model inputs rather than independent experimental datasets.

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